Course Length: 5 days
This course explains the concepts and techniques used in testing mixed signal semiconductor devices with automated test equipment (ATE). Practical information is presented pertaining to test program development, debugging techniques and test result interpretation. Static, Dynamic and AC tests are discussed in detail. Digital-to-Analog Converters (DAC) and Analog-to-Digital Converters (ADC) are used as sample devices to develop a full suite of test techniques for use with any mixed signal device.
Our goal is to provide useful, practical information that will quickly improve the skill set required to be a productive Test, Product or Applications Engineer. We present an environment where questions and interactions are welcome and everyone is treated with respect regardless of their experience level.
Introduction to Mixed Signal Testing and the Components of a Mixed Signal Test System
The Mathematical Basis of Digital Signal Processing
Principles of Analog Signal Theory
Static Parameters Testing of a DAC
Static Parameters Testing of an ADC
Sampling theory and how to correctly sample an analog signal
Dynamic Parameters Testing of a DAC
Dynamic Parameters Testing of an ADC
Creating Analog Signals with a Waveform Generator
DUT Connections to Reduce Analog and Digital Signal Interference
How to Use Analog Filtering and Other Signal Conditioning
Typical DSP Algorithms and When and How to Use Them
Extracting Test Measurements from Sampled Data and Relating
The Fundamentals of Mixed Signal Testing text, DSP Lab Software diskette, and all classroom materials are provided with the course.
Students should have completed the Soft Test Digital Test Technology class or have equivalent experience. Prior exposure to engineering mathematics is assumed.