This two-day course focuses on the fundamentals of Algorithmic Test Patterns and their use for fault detection within memory devices. The ability of each unique pattern to detect Specific Fault Types and the advantages and disadvantages associated with each pattern are discussed in detail. To simplify the complexities associated with various Algorithmic Test Patterns, a Static RAM is used as the primary test circuit throughout this course.
Who should attend
This course is designed to present the fundamentals of Memory Component Test for Test and Product engineers who are new to the field of Memory Test. Upon completion of this course the attendees will understand Algorithmic Test Patterns, how they are created and how they are used. They will have also gained an understanding of Memory Test System Architecture, their options and use.
When & Where
Soft Test offer on site training at your location. Give us a call to schedule an on site class or click Schedules for the latest class schedule.
The cost to attend this two-day course is $795.00 US, per attendee and includes all course material.
“The Fundamentals of Memory Test Methodology” text and all class materials is included with the class and serves as a valuable reference.