Digital Testing – Syllabus

Modules 1 through 8 make up the 4 day course. Module 9 (DFT Fundamentals) is included as the 5th day.

Module 1

Introduction to Test
The Bottom Line
Basic Terms
Environmental Testing
Voltage Stress
Shake and Bake
Why Test?
What is The Correct Way to Test?
What will be Tested?
Program Flow
Test Summary
Chapter Questions – Review

Module 2

Test System Architecture
Basic Terms
The Test System
What’s in a Test System?
Control Functions
DC Instrumentation
Functional/AC Instrumentation
Basic Guidelines
Chapter Questions – Review

Module 3

Device Specifications
Basic Terms
The Device Specifications
Test Conditions and Limits
Parameters that Apply to DC Parametric Testing
Parameters that Apply to Functional and AC Testing
Logical Functions
Reading Device Specifications
256 x 4 RAM Specifications
Interpreting the Device Specification
Device Specifications and Test Conditions
A workbook Exercise
Chapter Questions – Review

Module 4

Opens and Shorts – PMU Method
Why Test for Opens and Shorts?
Opens and Shorts Serial Static
Datalogs and Troubleshooting
Chapter Questions – Review

Module 5

Verifying DC Parameters
Basic Terms
DC Tests and the Hidden Resistance
Ohm’s Law and DC Testing
IDD Gross Current
IDD Static Current
IDDQ Current
IDD Dynamic Current
Input Currents (IIL/IIH)
Resistive Inputs-Pull-ups and Pull-downs
Output Fanout
High Impedance Currents (IOZL/IOZH)
Input Clamp (VI)
Output Short Circuit Current (IOS)
Chapter Questions – Review

Module 6

Verifying Functional Parameters
Introduction to Functional Testing
Basic Terms
Functional Testing
The Test Cycle
Input Data
Input Signal Formats
Developing Input Signal Timings
Output Data
Testing Outputs
Testing Valid (L/H) Output Levels
Output Testing using an Edge Strobe
Output Testing using a Window Strobe
High Impedance (Z-state) Output Levels
Output Current Loading
Developing Output Strobe Timing
Output Loading for AC Tests
Vector Data
Functional Specifications
Gross Functional Tests
Equation Based Timing
Functionally Testing a Device
Sample Device Specification
Specification Test Conditions for the Clocked Inverter
Gross Functional Test Conditions for the Clocked Inverter
Test Program Statements for Clocked Inverter
Standard Functional Tests
Opens and Shorts – Functional Method
VOL/IOL VOH/IOH Functional Test
Resistive Output Loading Input/Output Levels
Functional Z-State – High Impedance Testing
Open Drain / Open Source
Chapter Questions – Review

Module 7

Testing AC Parameters
AC Parametric Testing
Read & Record
Go-Nogo Testing
Standard AC Parameters
Rise Time
Fall Time
Setup Time
Hold Time
Propagation Delay Measurements
Minimum Pulse
Maximum Frequency
Output Enable Time
Output Disable Time
AC Specifications from 256 x 4 Static RAM Data Sheet
Developing Functional Timing
Write Cycle Timing Student Exercise
Chapter Questions – Review

Module 8

Device Characteristics
Characterization Overview
Test Vectors and Characterization
Defining Characterization Parameters
Common Characterization Parameters
Use of Test System Tools
The Test System Datalogger
The Linear
The Binary Search
Binary Search – Input Timings
Binary Search – Output
Threshold/Level Search
Shmoo Plots
Chapter Questions – Review

Module 9

Design for Testability – DFT
The DFT Fundamentals 1-day seminar is the last day of the 5-day course. Click here for details.

Course Summary

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