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Memory
Testing Course - Details
Course Length Standard: 2 days
Goal
The information presented will provide:
- An understanding of basic Memory Device Architecture
- An understanding of ATE Memory Test System Architecture and Options Methods of detecting various faults within memory devices
- Tips for producing quality Test Programs with maximum throughput
Content
- Basics of functional memory testing using ATE (automated test equipment)
- Developing and using Algorithmic Patterns (software code examples)
- Interactive Spread-Sheet to calculate test times based on memory size and cycle times
- Debug and trouble shooting techniques
- Reference Manual and CD-ROM software included
Distribution
Materials
Fundamentals of Memory Testing text and all class materials.
Prerequisites
Attendees must have an understanding of logic devices, basic test
methodologies and a fundamental understanding of ATE equipment.
Soft Test's Digital Test Methodology class is a recommended prerequisite.
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Soft Test Inc. P.O. Box 2230 New Smyrna Beach, Fl 32169 Phone: 386-478-1979 FAX: 386-478-1760 http://www.soft-test.com |
Copyright 1984 - 2006 | Soft Test, Inc. | All Rights Reserved
