Memory Testing – Course Details

Course Length Standard: 2 days

Goal

The information presented will provide:

  • An understanding of basic Memory Device Architecture
  • An understanding of ATE Memory Test System Architecture and Options Methods of detecting various faults within memory devices
  • Tips for producing quality Test Programs with maximum throughput

Content

  • Basics of functional memory testing using ATE (automated test equipment)
  • Developing and using Algorithmic Patterns (software code examples)
  • Interactive Spread-Sheet to calculate test times based on memory size and cycle times
  • Debug and trouble shooting techniques
  • Reference Manual and CD-ROM software included
  • Distribution Materials
  • Fundamentals of Memory Testing text and all class materials.

Prerequisites

Attendees must have an understanding of logic devices, basic test methodologies and a fundamental understanding of ATE equipment. Soft Test’s Digital Test Methodology class is a recommended prerequisite.

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