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Microelectronics Failure Analysis
Course Syllabus
Save 10% Off Any 3 DVD Combination, or Save Over $1000 on the Complete Set of All 10 DVDs!
Click on an individual DVD Gold Button for details of that DVD
| DVD # | Lecture | Topics (Click DVD # for Sample Video) | Presenter |
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Cost: $500 |
1 |
Introduction to Failure Analysis |
Rich Anderson - Sandia Labs |
| 2 | Basic Failure Analysis Techniques I | Chris Henderson -Semitracks Inc. | |
| 3 |
Basic Failure Analysis Techniques II |
Chris Henderson - Semitracks Inc. | |
 Cost: $500 |
4 |
Electron Microscopy |
Larry Wagner
- Texas Instruments |
| 5 |
Fault Isolation Scanning Optical Microscopy |
Ed Cole - Sandia Labs |
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| 6 | IC Packaging Technology & Analytical Methods | Tom Moore
- Omniprobe, Inc. |
|
 Cost: $500 |
7 | Decapsulation and Package Analysis | Mike Strizich
- ASI |
| 8 | Fault Isolation Optical Techniques | Ed Cole - Sandia Labs |
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| 9 | Atomic Force Microscopy | Pai Tangyunyong
- Sandia Labs |
|
 Cost: $500 |
10 | Deprocessing and Sample Preparation | Mike Strizich
- ASI |
| 11 | Soft Defect Localization |
Ed Cole - Sandia Labs |
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| 12 | Advanced Fault Isolation - Thermal Imaging | Dan Barton
- Sandia Labs |
|
 Cost: $500 |
13 | Issues of Backside Sample Prep |
Dan Barton - Sandia Labs |
| 14 | Backside Analysis Techniques | Mike Bruce
- AMD |
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| 15 | Photoemission Techniques |
Dan Barton - Sandia Labs |
|
 Cost: $500 |
16 | Electronics of Failure I | Chuck Hawkins - UNM |
| 17 | Electronics of Failure II |
Chuck Hawkins - UNM |
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| 18 | Optoelectronic Device FA | Dan Barton
- Sandia Labs |
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 Cost: $500 |
19 | EOS / ESD |
Chuck Hawkins - UNM |
| 20 | Advanced Fault Isolation 1: SQUID microscopy | Lee Knaus
- Neocera Corp. |
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| 21 | Advanced Fault Isolation 2: SQUID microscopy | Lee Knaus
- Neocera Corp. |
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 Cost: $500 |
22 | Focused Ion Beam (FIB) methods | Joe Michael Sandia Labs |
| 23 | MEMS Failure Analysis I | Jerry Walraven - Sandia Labs |
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| 24 | MEMS Failure Analysis 2 | Jerry Walraven - Sandia Labs |
|
 Cost: $500 |
25 | Failure Analysis in High Volume Manufacturing | Kathy Clark |
| 26 | Integrated Circuit Debug and Validation | Lawrence Clark
- UNM |
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| 27 | Elemental Analysis for FA | Paul Kotula
- Sandia Labs |
|
 Cost: $500 |
28 | Focus on Structural Test: AC Scan | Alfred Crouch Inovys Corp. |
| 29 | Failure Analysis Lab Management | Dick Ross - IBM |
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| 30 | Course Summary | Chuck
Hawkins - UNM |
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Overview Cost: $3995 |
1 - 30 |
Microelectronics Failure Analysis Complete DVD Course Includes all 30 Lectures each approximately 75 minutes long , total lecture time is approximately 37.5 hours. Also includes all Accompaniment Slides. (Save Over $1,000.00) |
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Soft Test Inc. P.O. Box 2230 New Smyrna Beach, Fl 32169 Phone: 386-478-1979 FAX: 386-478-1760 http://www.soft-test.com |
Copyright 1984 - 2006 | Soft Test, Inc. | All Rights Reserved
