Microelectronics Failure Analysis

DVD 7

Lecture 19

"EOS / ESD"
Presenter: Chuck Hawkins 
UNM

Professor Hawkins in back again in lecture 19, this time he discusses Electrical OverStress and Elector Static Discharge. Chuck explains EOS/ESD: what they are and how to tell the difference.  

Topics:

• Electrical Over Stress / Electro Static Discharge

• EOS / ESD Damage

• ESD Awareness 

• Damage Mechanisms

• Triboelectric Series

•  ESD Models

•  HBM / FICDM Test Methods

•  Failure Analysis - Is It EOS or ESD

•  ESD Protection Circuitry

• Prevention

Included with this lecture, you will receive 29 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Chuck Hawkins

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Lecture 20

"Advanced Fault Isolation 1: SQUID microscopy"
Presenter:  Lee Knaus
Neocera
 

Lecture 20  - Lee has worked on development of the Advanced Fault Isolation Microscopy system called the Superconducting Quantum Interference Device (SQUID). Lee explains why this technology is needed and the type of defects that can be localized by its use.

Topics:

• Magnetic Field Imaging 

• Paradigm Shift in IC Packaging

• How SQUID works 

• Block Diagram of a SQUID Microscope

• SQUID - Sample Separation

• Example Applications

• Multichip Module Imaging 

• Processor Magnetic / Current Image overlays

Included with this lecture, you will receive 28 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of  Lee Knaus

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 21
 
"Advanced Fault Isolation 2: SQUID Microscopy"
Presenter:  Lee Knaus
Neocera Corp.

Lecture 21 is the second half of Lee's lecture on the SQUID Microscope. Lee continues to explain how the instrument is used for current imaging and its use for  failure analysis in semiconductor applications.

Topics:

• Localizing Short Circuits with MAGMA-C1

• Current Image Overlay Backside 

• Current Image Overlay Frontside

• Defect Location

• Test Subject

• Background & Current Magnetic Fields

• Technique Comparison

• Scanning SQUID Capability Limits

• and more...

Included with this lecture, you will receive 44 presentation slides in PDF format. Lecture time is approximately 75 minutes

Click here for a biography of  Lee Knaus

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here
 

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