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Microelectronics Failure Analysis
DVD 6
Lecture 16
"Electronics of Failure I"
Presenter: Chuck Hawkins
UNM
In lecture 16 Professor Hawkins defines "Reliability". He compares electronic reliability of various technologies such as vacuum tubes vs. ICs, and gives examples of companies that have gone out of business due to product reliability issues. This leads to a detailed discussion of the following topics.
Topics:
- Models, Data, and the Bathtub Curve
- Point Defects
- Electromigration
- Stress Voiding
- Test Basics: Function, Fault, Defect-Based Testing
- Speed Testing
- Stuck-at Fault Model
- IDDQ Testing
- Design for Test (DFT)
- System on a Chip (SOC)
Included with this lecture, you will receive 45 presentation slides in PDF format. Lecture time is approximately 75 minutes.
Click here for a biography of Chuck Hawkins
Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use.
Note: Sample Video Clips require Windows Media Player. If you
do not have it, you can download it here for Free Click the Windows Icon to
Begin downloading
Mac Users Click here
Lecture 17
"Electronics of Failure II"
Presenter: Chuck Hawkins
UNM
Lecture 17 - Chuck continues his discussion focusing on defect detection using a strategy known as "Defect-Based-Testing". This involves understanding the type of defects that are likely to occur, and developing tests that target the change in circuit behavior caused by the defect. This test approach is much different than simply verifying that the circuit is functional and meeting its data-book parameters.
Topics:
- Electronic Properties of Defects
- Defect Based Testing
- Low VDD Failure Mechanisms
- Functionality and Setup and Hold Times
- Bridge & Open Defects
- Parametric Failures
- Defect-Based Test Analysis
Included with this lecture, you will receive 40 presentation slides in PDF format. Lecture time is approximately 75 minutes
Click here for a biography of Chuck Hawkins
Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use.
Note: Sample Video Clips require Windows Media Player. If you
do not have it, you can download it here for Free Click the Windows Icon to
Begin downloading
Mac Users Click here
Lecture 18
"Optoelectronic Device FA"
Presenter: Dan Barton
Sandia Labs
In lecture 18 Dan explains LASER basics and provides a wealth of pictures illustrating various failure modes of optoelectronics.
Topics:
- Opto materials, devices and defects introduction
- Advanced sample preparation methods
- How FIBs make our lives easier
- Classic FA tools
- Photoluminescence
- Cathodoluminescence
- Electroluminescence
- EBIC / TEM
- Plan view vs. cross section TEM analysis
- Advanced FA tools
- TIVA and its application to Opto FA
Included with this lecture, you will receive 63 presentation slides in PDF format. Lecture time is approximately 75 minutes.
Click here for a biography of Dan Barton
Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use.
Note: Sample Video Clips require Windows Media Player. If you
do not have it, you can download it here for Free Click the Windows Icon to
Begin downloading
Mac Users
Click here
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