Microelectronics Failure Analysis

DVD 3

Lecture 7

"Decapsulation and Package Analysis"
Presenter: Mike Strizich 
ASI 

In Lecture 7 Mike discusses current packing technology, and the process of performing FA to discover various failure modes.

Topics:

•  Package Analysis Techniques

•  Orderly Steps

•  Non-Destructive vs.Destructive

•  Typical Package Failure Modes

•  Decapsulation Techniques

•  Plastic Packages

•  Cavity type Packages

Included with this lecture, you will receive 49 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Mike Strizich

Click here for a sample video of the presentation in Windows Media format.Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

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Lecture 8

"Fault Isolation Optical Techniques "
Presenter: Ed Cole 
Sandia Labs

Lecture 8 provides an opportunity for Ed to continue his discussion from Lecture 5 regarding optical techniques of FA using lasers. 

Topics:

• Laser Beam Approaches & Techniques

•  Imaging Confocal  

•  Imaging Backside 

•  Photocurrent Generation (OBIC, LIVA)

•  LIVA Completed and Thermal Approaches

•  SEI and TIVA

Included with this lecture, you will receive 34 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Ed Cole

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 9

"Atomic Force Microscopy"
Presenter: Pai Tangyunyong
Sandia Labs

In  lecture 9 Pai explains Scan Probe Microscopy (SPM) and Scanning Force Microscopy (SFM).

Topics:

•  What is SPM

•  Common Features - SPM

•  Image Acquisition - SPM

•  Scanning Force Microscopy (SFM) or AFM

•  Contact, Tapping, and Non-Contact 

•  Scanning Capacitance Microscopy

Included with this lecture, you will receive 46 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Pai Tangyunyong

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

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