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DVD 10 - Lecture 28-30
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Microelectronics Failure Analysis

DVD 10


Lecture 28
 
"Focus on Structural Test: AC Scan"
Presenter: Alfred Crouch
Inovys Corp.

Al Crouch is a leader in DFT, and is a master at making the complex sound simple.  In lecture 28 Al explains how Design for Test (DFT) technology is used to provide information useful for identifying and locating defects, that can then be investigated through FA.

Topics:

  • What's Driving Modern Test Technology?

  • IP Reuse / SoC Integration Problem

  • Predominant Failure Mode

  • Structural Test and DFT/EDA

  • Types of Structural Test

  • Structural Deterministic Test

  • What is AC Scan?

  • All about Signal Paths

  • Automating Path-Based ATPG

  • AC Scan for Physical Debug

Included with this lecture, you will receive 110 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Alfred L. Crouch

Click here for a sample video of the presentation in Windows Media format

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Lecture 29
 
"Failure Analysis Lab Management"
Presenter: Dick Ross 
IBM 

Lecture 29 is somewhat different from the other lectures. Until now most of the lecture material has focused on engineering/science, Dick's lecture is people/management oriented. This is an excellent presentation explaining what it takes to put together and manage a first rate Failure Analysis Lab. Dick's years of experience provides the necessary background for this topic. 

Topics:

  • Staffing

  • Lab Organization

  • Lab Design

  • Lab Operations

  • Development

  • Financial Mgmt

  • Metrics

  • Summary

Included with this lecture, you will receive 89 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Dick Ross 

Click here for a sample video of the presentation in Windows Media format

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Get Windows Media Player

Mac Users Click here


Lecture 30
 
"Course Summary"
Presenter: Chuck Hawkins 
UNM

Lecture 30 - Professor Hawkins presents a summary to the Microelectronics Failure Analysis Lecture Series.

There are no presentation slides associated with this lecture. Lecture time is approximately 75 minutes.

Click here for a biography of Chuck Hawkins

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 


Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Get Windows Media Player

Mac Users Click here

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