Microelectronics Failure Analysis

DVD 1

Lecture 1

"Introduction to Failure Analysis"

Presenter: Rich Anderson
 Sandia Labs

In Lecture 1 Rich  presents an introduction to Failure Analysis and also highlights the topics to be covered in the course. This lecture is a good overview of the FA process.

Topics:

• Introduce the general concept of FA

• Describe the role of FA in the IC industry

• Show examples of the FA process

• Microelectronics challenges for FA

• Describe the content of this course

• Provide resources for more information

Included with this lecture, you will receive 40 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Rich Anderson

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 2

"Basic Failure Analysis Techniques I"

Presenter: Chris Henderson
Semitracks Inc.

In lecture 2 Chris begins laying out the process of FA. As his explanation unfolds he introduces many terms and concepts that will be built upon later in the course. Chris is very good at presenting complex topics in clear and simple terms, yet he manages to include many details in the process. 

Some of the issues covered are: Fault Isolation, Deprocessing, Inspection (PEM, liquid crystal, wet etch, dry etch, optical, SEM, microprobing, and FIB).

Topics:

• Motivation for FA
• Basic Philosophical Principles
• Practical Principles
• Process Flow Diagrams

Included with lectures 2 and 3, you will receive 95 presentation slides in PDF format. Lecture time is approximately 75 minutes pre lecture.

Click here for a biography of Chris Henderson

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 3

"Basic Failure Analysis Techniques II"

Presenter: Chris Henderson
Semitracks Inc.

Lecture 3 continues with the topics listed below. 

Topics:

• Fault Localization  / Fault Isolation
• Microlocalization Techniques
• Analytical Characterization
• Fault/Defect Isolation Techniques
• FA Tools:Electron Beam, Ion Beam, Thermal Detection
• Infrared Imaging
• Light Emission Microscopy
• “Hot Spot” Analysis
• Charge-Induced Voltage Alteration
• CIVA Imaging
• And Lots More...

Included with lectures 2 and 3, you will receive 95 presentation slides in PDF format. Lecture time is approximately 75 minutes pre lecture.

Click here for a biography of Chris Henderson

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here
 

Copyright 1984 - 2008 | Soft Test, Inc. |  All Rights Reserved