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DVD 9 - Lecture 25-27
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Microelectronics Test Engineering

DVD 9


Lecture 25
 
"Analog & Mixed Signal Testing IV"
Presenter: Professor Greg Donohoe

Lecture 25 is the second half of Greg's lecture. In this lecture Greg completes his discussion on signal sampling.

Topics:

  • Window Functions

  • Coherency Formula

  • Frequency Relationships

  • Unit Test Period

  • FFT / INVERSE FFT

  • UnderSampling

  • More ...

Included with this lecture, you will receive 36 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Greg Donohoe

Click here for a sample video of the presentation in Windows Media format

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Lecture 26
 
"Leading Edge of Wafer Test Technology"
Presenter: Bill Mann
Consultant

In Lecture 26 Bill presents his view on the Leading Edge of wafer test. In this lecture you will lean the state-of-the-art of probe technology. Bill has first hand knowledge of all the topics listed below, and he supports his explanation with an assortment of detailed pictures and graphics.

Topics:

  • Introduction

  • Finest Pitch

  • Highest Pin Counts

  • Biggest Probe Card

  • Highest Frequency

  • I/O Pad and Solder Ball Deformation

  • Probe Needle Cleaning

  • Sorting Good From Bad Die

Included with this lecture, you will receive 62 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of  Bill Mann 

Click here for a sample video of the presentation in Windows Media format

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Get Windows Media Player

Mac Users Click here


Lecture 27
 
"Analog & Mixed Signal Testing II"
Presenter: Peter Lindholm
Consultant

Lecture 27 is Peter's second in the series. In this lecture Peter explains the details of testing DAC and ADC circuits - not only how each test is performed but also why each test is needed. 

Topics:

  • DAC Block Diagram

  • DAC Full Scale Range

  • Offset & Gain Error

  • DAC Differential / Integral Nonlinearity

  • DAC Monotonic Behavior

  • Example DAC Data Sheet

  • High Bandwidth Analog Input

  • Quantization Error 

  • ADC Block Diagram

  • ADC Static Testing

  • Transition Voltages (VT)

  • Code Width

  • Full Scale Transition / Range

  • Offset Voltage / Error

  • Gain Voltage / Error

  • More ...

Included with this lecture, you will receive 87 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Peter Lindholm

Click here for a sample video of the presentation in Windows Media format

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Get Windows Media Player

Mac Users Click here

 

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