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DVD 9 Lecture 25 Lecture 25 is the second half of Greg's lecture. In this lecture Greg completes his discussion on signal sampling. Topics:
Included with this lecture, you will receive 36 presentation slides in PDF format. Lecture time is approximately 75 minutes. Click here for a biography of Greg Donohoe Click here for a sample video of the presentation in Windows Media format
Note: Sample Video Clips require Windows Media Player. If you
do not have it, you can download it here for Free Click the Windows Icon to
Begin downloading Mac Users Click here Lecture 26 In Lecture 26 Bill presents his view on the Leading Edge of
wafer test. In this lecture you will lean the state-of-the-art of probe
technology. Bill has first hand knowledge of all the topics listed below,
and he supports his explanation with an assortment of detailed pictures and
graphics.
Included with this lecture, you will receive 62 presentation slides in PDF format. Lecture time is approximately 75 minutes. Click here for a biography of Bill Mann Click here for a sample video of the presentation in Windows Media format
Note: Sample Video Clips require Windows Media Player. If you
do not have it, you can download it here for Free Click the Windows Icon to
Begin downloading Mac Users Click here Lecture 27 Lecture 27 is Peter's second in the series. In this lecture Peter explains the details of testing DAC and ADC circuits - not only how each test is performed but also why each test is needed. Topics:
Included with this lecture, you will receive 87 presentation slides in PDF format. Lecture time is approximately 75 minutes. Click here for a biography of Peter Lindholm Click here for a sample video of the presentation in Windows Media format
Note: Sample Video Clips require Windows Media Player. If you
do not have it, you can download it here for Free Click the Windows Icon to
Begin downloading Mac Users Click here
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