Microelectronics Test Engineering

DVD 8

Lecture 22

"IP and SoC Test Basics III"
Presenter: Al Crouch
Inovys

Lecture 22 is Al's third in the series. In this lecture Al explains the inter-workings of Scan chains. Using a variety of slides, stories, and data from ATE/EDA tools he demonstrates ways of locating and debugging problems in broken Scan chains. Anyone working with Logic Scan will find this lecture very valuable.

Topics:

• The Problem Space

• The IP Reuse / SoC Integration Problem

• Flow of Structural Data

• What is Scan Debug?

• Scan Testing Problems

• Diagnostic Techniques

• Scan Shift Testing

• ATPG Tests

• Scan Recovery

• Scan Dump Data Map

Included with this lecture, you will receive 80 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Al Crouch

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Lecture 23

"Analog & Mixed Signal Testing I"
Presenter: Peter Lindholm
Consultant

Lecture 23 is Peter's first in the series. In this lecture Peter introduces the test hardware found in a mixed signal test system, he then explains the basic concepts of testing analog-to-digital and digital-to-analog converters, covering both static and dynamic parameters. 

Topics:

• Mixed Signal Overview

• Mixed Signal ATE

• Mathematics 

• Digital to Analog Converters – Static Test 

• Analog to Digital Converters – Static Test

• Signal Analysis  

• DACs and ADCs – Dynamic Testing 

• Transmission Lines and Terminations

Included with this lecture, you will receive 43 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Peter Lindholm

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

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Lecture 24

"Analog & Mixed Signal Testing III"
Presenter: Professor Greg Donohoe
University of New Mexico

In Lecture 24 Greg first reviews the math associated with signal sampling, and he then explains how to go about setup a test and sampling a signal.

Topics:

• Decibel Ratios

• Sine Wave Squared

• Time to Frequency Translation

• Fourier Series Calculations

• Shannon vs Nyquist Rates

• Anti-Aliasing Filter

Included with this lecture, you will receive 36 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Greg Donohoe

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

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