Microelectronics Test Engineering

DVD 7

Lecture 19

"Testers ATE – Past, Present, Future"
Presenter:  Bob Huston 

Lecture 19 features Bob Huston. Bob is one of the driving forces within the ATE community. His hardware and software designs have had an enormous impact on the methodologies and practices of semiconductor test. In this lecture Bob explains the need for cost effective test, then goes on to explain the inter-workings of complex ATE.

Topics:

• Architectural Forces

• Drive Waveforms

• How Many Timing Markers?

• Pattern Generation

• Functional Modules

• Sequencer Maneuvers

• Multiplexed Timing

• Tester Building Blocks

• more...

Included with this lecture, you will receive 26 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Bob Huston 

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Lecture 20

"IP and SoC Test Basics I"
Presenter: Al Crouch
Inovys

Lecture 20 is the first of three lectures presented by Al. This lecture focuses on Intellectual Property (IP) and System-on-a-Chip (SoC) designs. Regarding the use of IP, Al makes the benefits of IP (recycling other peoples work) extremely clear. Al is very knowable in this area and his presentation skills are second to none. All of Al's presentations are informative, current, and entertaining. 

Topics:

• Introduce Intellectual Property (IP) Cores

• Discuss Reusability (Reuse)

• Introduce Systems-on-a-Chip (SoC)

• Discuss DFT, Test, and Test Methodology

• DFT Technique and methodology drivers

• Analysis Methods

• A Simple Case Study of a System-on-a-Chip

• more...

Included with this lecture, you will receive 51 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Al Crouch

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

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Lecture 21
 
"IP and SoC Test Basics II"
Presenter: Al Crouch
Inovys

Lecture 21 is the second of three lectures presented by Al. In this lecture Al completes his discussion on IP and SoC. Next he introduces the subject of Structural Test and DFT, this is a subject that Al knows very well. He covers the topics of DC and AC Scan and explains the finer points of clock and signal timings. The lecture concludes with the topic of Signal Paths and Delay Testing. Still to go - Lecture 22 Part III.

Topics:

• What is Driving Modern Test Technology? 

• 300mm Wafers

• Volume Silicon/Test

• Multi-Site Testing

• Bare Die Testing

• Deep-Submicron/Nanometer Design

• New Failure Modes

• Massive Integration

• SoC Design

• Massive Integration

• Reuse Vectors

• Time-to-Market

• more...

Included with this lecture, you will receive 78 presentation slides in PDF format. Lecture time is approximately 75 minutes

Click here for a biography of Al Crouch

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here
 

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