Microelectronics Test Engineering

DVD 6

Lecture 16

"Memory Test - Part 2"
Presenter: Rob Aitken
Artisan

Lecture 16 is the second half of Rob's presentation of Memory Test. This lecture focuses on Test Patterns, BIST, Repair and Yield Issues. You are certain to find these combined presentations (lectures 11 & 16) valuable regardless of your experience level, and you are likely to be surprised at the amount of information that Rob packs into these two lectures. 

Topics:

Part 1 - Lecture 11

• Basics of Memory Operation
• Defect Behavior
• Simple Tests
• March Patterns

Part 2 - Lecture 16

• APG and Memory Testers
• BIST
• Yield
• Diagnosis and Repair
• BISR

Included with this lecture, you will receive 50 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Rob Aitken

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Lecture 17

"Board and System Test I"
Presenter: Gordon Robinson 
Consultant

Lecture 17 is the first of a two part Lecture. In this lecture Gordon explains some of the differences between board test and component test. Component test engineers will likely find this to be very interesting material. Although the challenges to board test are different from component test, being aware of the considerations and solutions, can advance our debug techniques in chip test. Gordon goes on to explain the issues involved with testing both digital and analog circuits at the board level.

Topics:

• Testing More Than a Chip
• Special Board Characteristics
• Assembly Problems
• Board Test Technologies
• Analog In-Circuit Test
• Digital In-Circuit Test
• 1149.1 Architecture

Included with this lecture, you will receive 61 presentation slides in PDF format. Lecture time is approximately 75 minutes

Click here for a biography of Gordon Robinson

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 18

"Board and System Test II"
Presenter: Gordon Robinson 
Consultant

Lecture 18 is the second of a two part Lecture. In part 2 Gordon gets into the specific details of board test. This lecture clearly illustrates the experience level of the presenter. Many challenging issues are directly confronted and explained in step-by-step detail. If you plan to be involved in board test, or if you are working with 1149.1 enabled devices you will benefit from this two part lecture.

Topics:

• Boundary Scan Testing
• 1149.1 Architecture
• Interconnect Test
• Identifiers: “Counting” Patterns
• Ground Bounce Avoidance
• Partial Boundary-Scan Boards
• Input XOR/NAND Trees
• High-Speed “Boundary-Scan
• 1149.6 Standard
• more...

Included with this lecture, you will receive 66 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Gordon Robinson

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here
 

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