Microelectronics Test Engineering

DVD 5

Lecture 13

"Hardware Capabilities"
Presenter: Burnie West
Credence

In Lecture 13 Burnie explains, then questions, the approach and architecture of ATE design. Vectors, Waverforms, Timings, Accuracy - across many pins have been a challenge for ATE for the past 35 years. Burnie shares his views on the problems and possible solutions for the future. ATE test must continue to evolve, Burnie explains why.

Topics:

• Why test?
• IC Test and Measurement Objectives
• What kinds of test to apply? When?
• How testers apply test vectors
• Functional, Scan, BIST, repair, IDDQ
• Tester timing generation techniques
• Speed, accuracy, and complexity issues
• Error sources and accuracy calculations
• Consequence of internal clock multipliers
• Launch-Capture for Delay Fault Testing
• Consequences to the Test Vector model
• Evolving challenges of test engineering

Included with this lecture, you will receive 56 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of  Burnie West 

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

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Lecture 14

"Wafer Testing Technology"
Presenter: Bill Mann
Consultant

Lecture 14 is extremely informative! Bill presents state-of-the-art information covering a wide range of wafer test related topics. His explanations, along with an abundance of excellent photographs, makes wafer test seem clear and simple (even though we know it's not). Viewing this lecture is 75 minuets well spent, don't miss it.

Topics:

• Wafer Testing Overview
• Sorting good from bad die
• Yield feedback
• Probe Test Cell
• Prober
• I/O pads
• Probe cards
• Challenges
• Device shrinks and reduced pitch
• Thorough probe testing
• Wafer test cost

Included with this lecture, you will receive 55 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of  Bill Mann 

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 15

"Test Vector & Program Development"
Presenter: Laura Suriano
Intel 

Lecture 15 - Laura has worked on a number of projects at Intel and shares her experiences in a way that brings her discussions to life. Rather than just explaining the meaning of each topic, Laura shares related stories, which not only makes it easier to understand the material, but also makes the information easier to remember. You will enjoy Lecture 15 and it is very informative.

Topics:

• Test Vector Development

• Simulation data

• Test Program Development

• Creating a Test Program

• Troubleshooting

Included with this lecture, you will receive 26 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Laura Soriano 

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here
 

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