Microelectronics Test Engineering

DVD 4

Lecture 10

"CMOS Defect-Based Testing"
Presenter: Anne Gattiker - IBM 
Lecture by Professor Chuck Hawkins

The material for Lecture 10 was prepared by Anne Gattiker of IBM. Anne was unable to make the presentation, Professor Hawkins fills in for her.

Defect-Based Testing is a strategy that involves targeting specific defects that are likely to occur with tests that are capable of detection. Of course it is not as simple as it sounds. Anne has years of experience with DBT and her material and examples will help you to quickly gain an understanding of this process.

Topics:

• Detection technique basics

• Defect types
   -Shorts
   -Opens
   -Parametric

• Voltage Tests

• IDDQ Tests 

• Critical Resistance 

• Low Voltage Test

• More detection techniques

Included with this lecture, you will receive 49 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Anne Gattiker

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Lecture 11

"Memory Test - Part 1"
Presenter: Rob Aitken
Artisan

Lecture 11 is the first is a two part lecture presentation. In lecture 11 Rob provides a detailed look at the design and performance of memories. He explains how they work, what can go wrong, what type of tests are used to target certain defects, and the appropriate test patterns. You will find this presentation valuable regardless of your experience level, and you are likely to be surprised at the amount of information that Rob packs into this lecture. Lecture 16 completes Rob's presentation.

Topics:

Part 1 - Lecture 11

• Basics of Memory Operation

• Defect Behavior

• Simple Tests

• March Patterns

Part 2 - Lecture 16

• APG and Memory Testers

• BIST

• Yield

• Diagnosis and Repair

• BISR

Included with this lecture, you will receive 52 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Rob Aitken

Click here for a sample video of the presentation in Windows Media format.Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

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Lecture 12

"Test Cost Reduction with DFT"
Presenter: Gordon Robinson 
Consultant

Gordon begins Lecture 12 with a discussion of the "effectiveness" of test (good devices failing / defective devices passing!). We know this happens, but to what extent and at what cost? Gordon explains how DFT addresses issues often missed by traditional functional or application style testing. Using statistics from case studies, Gordon builds a strong case to illustrate the benefits and cost savings associated with DFT and structural test.

Topics:

• DFT Objectives

• Techniques And Cost Impact
   - Simple Scan
   - BIST
   - Not-So-Simple Scan
   - Reduced Pin Count Testing

• Testers With DFT Focus

Included with this lecture, you will receive 50 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Gordon Robinson

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here
 

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