Microelectronics Test Engineering

DVD 3

Lecture 7

"Test Types: Functional Testing "
Presenter: Chris Nelson 
Intel

In Lecture 7 Chris uses a simple sequential logic circuit to explain a variety of test concepts. Vectors, Waveforms, Timing, Test Hardware - it's all covered in an easy to understand discussion. Chris then moves on to more complex tests such as the Functional Opens and Shorts test, VIL/VIH test, and the Functional VOL/VOH test procedures. That's not all - Shmoo Plots and Search Routines conclude the lecture.

Topics:

• Introduction to Stored-Response Testers

• Pattern Generators

• Pin Electronics

• Mapping DUT behavior into Tester Cycles

• The Basics of Functional testing

• Functionally testing DC and AC parameters

• More...

Included with this lecture, you will receive 23 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Chris Nelson

Click here for a sample video of the presentation in Windows Media format.Note: Size and Quality of this clip have been reduced for web use. 

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Lecture 8

"Test Types: AC Parameters "
Presenter: Guy Perry 
Soft Test Inc.

Lecture 8 focuses on AC parameters: first explaining timing relationships of the signal edges, then discussing how each test is performed. An AC Device Specification is used to illustrate the process of developing the waveforms and timing on the ATE system. Once the ATE timing is defined a sample vector file is used to illustrate how the timing, waveforms and vectors work collectively to produce a complete functional test sequence. 

Topics:

• General AC Issues

• Individual Parameters

• Setup/Hold

• Output Propagation Delay

• Pulse Width Tests

• Maximum Frequency

• Output Enable / Disable

• Timing Diagrams

• Mapping the timing to the ATE System

• Vectors make it all come together

Included with this lecture, you will receive 23 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Guy Perry

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

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Lecture 9

"Design for Testability (DFT)"
Presenter: Professor Chuck Hawkins
University of New Mexico

Professor Hawkins is back in Lecture 9 to enlighten us on the basics of DFT. He covers the topics of Logic Scan, Boundary Scan (JTAG) and BIST. The logic structures and concepts of DFT are explained and the advantages of DFT are summarized. 

Part two of the lecture deals with Device Characterization. The fine points of characterization tools and techniques are explained and various Shmoo Plots are examined.

Topics:

• What is DFT

• Why DFT

• Examples -Ad hoc, Scan, BIST, JTAG

• Device Characterization

• What do we Characterize

• Shmoo Plots

• Linear and Binary Searches

Included with this lecture, you will receive 46 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Professor Hawkins

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here
 

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