Microelectronics Test Engineering

DVD 2

Lecture 4

"Introduction to Automated Test Equipment"
Presenter: Professor Hawkins
University of New Mexico

Lecture 4 addresses two areas. First, issues related to testing such as High/Low Temperatures, Gaurdbanding, Program Flow, Binning and Test Summaries are discussed. Then we take a detailed look at the components and hardware inside of the test system.

Topics:

• A review of photos

• Terms and definitions

• Stress Testing, Burn-in, and S&B

• Testing for Defects or Faults

• ATE Architecture

• ATE Components

• Current and voltage Clamps

• DPS Force and Sense

• Functional / AC Instrumentation

• Cycle and Edge Timing

• Pin Electronics

Included with this lecture, you will receive 46 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Professor Hawkins

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

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Lecture 5

"Test Types: Device Specs and DC Opens & Shorts"
Presenter: Guy Perry 
Soft Test Inc.

In Lecture 5 Guy explains the relationship between Device Specifications and the test conditions within the test program. Interpreting Device Specifications can be challenging until you become familiar with the content. This lecture provides a head start for understanding the structure and meaning of the various tables and parameters listed in standard specifications.

Part two of the lecture addresses DC Opens and Shorts testing. The test procedures are explained and passing / failing datalogs are reviewed. The discussion concludes with trouble-shooting techniques. 

Topics:

• Introduction to Device Specifications 

• Basic Terms

• Block Diagram

• Maximum Operating Conditions

• Operating Range

• DC Characteristics 

• Logic Table

• Opens & Shorts Testing

• Test procedures

• Testing Power Pins

• Interpreting the Datalog

• Trouble-shooting

Included with this lecture, you will receive 48 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Guy Perry

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 6

"Test Types: DC Parameters"
Presenter: Guy Perry 
Soft Test Inc.

Lecture 6 first looks at the test hardware associated with DC measurements. The lecture then addresses the common DC parametric (input/output/power) tests. Each test method is explained, a test datalog is viewed, and possible trouble-shooting strategies are discussed.

Topics:

• Basic Terms

• Overview of DC Test System Components

• PMU / Clamps / DPS / PE Circuits

• Program Flow - Placement of DC Tests

• Output Tests VOH/VOL

• Power Tests IDDS / IDDD / IDDQ

• Input Tests IIL/IIH

• Datalog / Trouble-shooting

Included with this lecture, you will receive 36 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Guy Perry

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart
 

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

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