DVD 10 - Lecture 28-30

Microelectronics Test Engineering

DVD 10

Lecture 28

"Analog & Mixed Signal Testing V"
Presenter: Peter Lindholm
Consultant

Lecture 28 is Peter's third in the series. Peter continues his discussion of mixed signal test - see the list of topics below.

Topics:

ADC Static Measurements Part 2
Dynamic Testing of Mixed Signal Devices
DAC Dynamic Measurements
Oversampling to Extend Dynamic Range
Successive Approximation (SAR)
Subranging
Delta-Sigma
Signal Classification
Harmonic Distortion
Frequency Domain Analysis
Noise Gaussian /Quantization
Noise in the Frequency Domain
Signal-to-Noise-and-Distortion
Intermodulation Distortion
Noise Gaussian /Quantization
Noise in the Frequency Domain
Signal-to-Noise-and-Distortion
Intermodulation Distortion

Included with this lecture, you will receive 87 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Peter Lindholm

Click here for a sample video of the presentation in Windows Media format

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Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 29

"Analog & Mixed Signal Testing VI"
Presenter: Peter Lindholm
Consultant

Lecture 29 is Peter's forth in the series. Peter continues his discussion of mixed signal test - see the list of topics below.

Topics:

Dynamic ADC Measurements
Dynamic Range
Spurs in the Frequency Domain
ADC Specification
AWG Coherent Sine
Reconstruction Filtering
Coherent Sampling
Analysis of Captured Data
Undersampling Equation
Sparkling
Signal Integrity
Transmission Lines and Terminations
Characteristic Impedance
Propagation Delay and Wavelength
Distributed Capacitance

Included with this lecture, you will receive 62 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Peter Lindholm

Click here for a sample video of the presentation in Windows Media format

Add To Cart View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 30

"Putting TE Feet to the Business: A Practical Perspective"
Presenter: Gene Hnatek
Qualcomm

Lecture 30 - Gene presents an overview of the problems and solutions involved with providing reliable, high quality semiconductors. Gene's lecture is based upon his many years of working within the industry - this is an excellent and practical presentation.

Topics:

What is the Test Process?
Test Requirements for Complex ICs
What Are The Challenges to Test?
Impact of Nanometer Technologies on Test
What is Now Required of Test Engineering?
Examples of Improving Test Coverage
Examples of Improving Defect Density and Yield
Examples of Improving Yield and Reducing Test Time
Improving Customer Perceived Quality
The Challenges of Testing 3D and Stacked Packages
Key Challenges for RF/Analog ICs
Some Tough Open Questions

Included with this lecture, you will receive 42 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Gene Hnatek

Click here for a sample video of the presentation in Windows Media format

Add To Cart View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Soft Test Inc.
P.O. Box 2230
New Smyrna Beach, Fl 32169
Phone: 386-478-1979
FAX: 386-478-1760
http://www.soft-test.com