Microelectronics Test Engineering

DVD 1

Lecture 1

"Introduction to Test & Test Economics"
Presenter: Professor Chuck Hawkins
University of New Mexico

In Lecture 1 Professor Hawkins presents an overview of semiconductor test, which sets the stage for the following lectures. 

Topics:

• Manufacturing of IC’s
• Typical IC flows
• Why do we test
• Goals of test
• What is good-what is bad?
• Operating window & examples
• Simple test problems
• The state of the art in IC test.

Included with this lecture, you will receive 26 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Professor Hawkins

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 2

"Economics of Test "
Presenter: Professor Hawkins
University of New Mexico

In lecture 2 Professor Hawkins introduces mathematical concepts associated with test costs. Some of the less obvious issues that affect yield are explained and an in depth discussion of test cost factors takes place.

Topics:

• What determines cost of test
• Yields- good and bad
• Simple cost calculations
• Engineering effort
• Depreciation
• Other cost adders
• Volume and cost tradeoffs

Included with this lecture, you will receive 30 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Professor Hawkins

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here

Lecture 3

"Test Basics, Function, Fault, and Defect-Based Testing"
Presenter: Professor Hawkins
University of New Mexico

Lecture 3 introduces three testing philosophies: testing for functionality, testing for defects, and tests based upon fault models. This lecture sets the groundwork for more advanced discussions to follow.

Topics:

• Distinguish 3 forms of testing
• Functional Testing
• Fault Model Testing (SAF)
• Defect-Based Testing
• How to generate a test vector
• Calculating Test Times
• Stuck-at Fault
• IDDQ
• Speed Testing

Included with this lecture, you will receive 33 presentation slides in PDF format. Lecture time is approximately 75 minutes.

Click here for a biography of Professor Hawkins

Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use. 

Add To Cart       View Cart

Note: Sample Video Clips require Windows Media Player. If you do not have it, you can download it here for Free Click the Windows Icon to Begin downloading

Mac Users Click here
 

Copyright 1984 - 2012 | Soft Test, Inc. |  All Rights Reserved