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Microelectronics Test Engineering
DVD 1
Lecture 1
"Introduction to Test & Test Economics"
Presenter: Professor Chuck Hawkins
University of New Mexico
In Lecture 1 Professor Hawkins presents an overview of semiconductor test, which sets the stage for the following lectures.
Topics:
- Manufacturing of IC’s
- Typical IC flows
- Why do we test
- Goals of test
- What is good-what is bad?
- Operating window & examples
- Simple test problems
- The state of the art in IC test.
Included with this lecture, you will receive 26 presentation slides in PDF format. Lecture time is approximately 75 minutes.
Click here for a biography of Professor Hawkins
Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use.
Note: Sample Video Clips require Windows Media Player. If you
do not have it, you can download it here for Free Click the Windows Icon to
Begin downloading
Mac Users Click here
Lecture 2
"Economics of Test "
Presenter: Professor Hawkins
University of New Mexico
In lecture 2 Professor Hawkins introduces mathematical concepts associated with test costs. Some of the less obvious issues that affect yield are explained and an in depth discussion of test cost factors takes place.
Topics:
- What determines cost of test
- Yields- good and bad
- Simple cost calculations
- Engineering effort
- Depreciation
- Other cost adders
- Volume and cost tradeoffs
Included with this lecture, you will receive 30 presentation slides in PDF format. Lecture time is approximately 75 minutes.
Click here for a biography of Professor Hawkins
Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use.
Note: Sample Video Clips require Windows Media Player. If you
do not have it, you can download it here for Free Click the Windows Icon to
Begin downloading
Mac Users Click here
Lecture 3
"Test Basics, Function, Fault, and Defect-Based Testing"
Presenter: Professor Hawkins
University of New Mexico
Lecture 3 introduces three testing philosophies: testing for functionality, testing for defects, and tests based upon fault models. This lecture sets the groundwork for more advanced discussions to follow.
Topics:
- Distinguish 3 forms of testing
- Functional Testing
- Fault Model Testing (SAF)
- Defect-Based Testing
- How to generate a test vector
- Calculating Test Times
- Stuck-at Fault
- IDDQ
- Speed Testing
Included with this lecture, you will receive 33 presentation slides in PDF format. Lecture time is approximately 75 minutes.
Click here for a biography of Professor Hawkins
Click here for a sample video of the presentation in Windows Media format. Note: Size and Quality of this clip have been reduced for web use.
Note: Sample Video Clips require Windows Media Player. If you
do not have it, you can download it here for Free Click the Windows Icon to
Begin downloading
Mac Users
Click here
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Soft Test Inc. P.O. Box 2230 New Smyrna Beach, Fl 32169 Phone: 386-478-1979 FAX: 386-478-1760 http://www.soft-test.com |
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