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Biography
Bill Mann - Southwest Test Workshop
William R. Mann received his BS and MS Degrees in Electrical Engineering from the University of California at Santa Barbara. He held numerous management positions during his 32 year career at Semiconductor Division of Rockwell International, and retired as the Executive Director of Quality, Test, and Product Engineering.
He has been involved in test technology and the IEEE International Test Conference for over 25 years. He serves on the ITC Program Committee, the Test Technology Technical Council, the advisory board for Design and Test of Computers, and as the General Chair of the Southwest Test Workshop, the only IEEE conference specializing in semiconductor wafer level testing. Bill is a Senior Member of the IEEE.
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