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Gene Hnatek - Qualcomm Corp.

Gene Hnatek is the Director of Quality and Reliability at Qualcomm Corp.  He has been involved for the past 30 years in IC fabrication, electrical test development, identification of failure mechanisms, and developing screening criteria.  He is the author of twelve books including Digital Integrated Circuit Testing from a Quality Perspective and Integrated Circuit Quality and reliability.   He teaches short course in these topics for the past ten years.

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Soft Test Inc.
P.O. Box 2230
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