Biography

Professor Chuck Hawkins

University of New Mexico

Chuck Hawkins is a Professor in the Electrical and Computer Engineering Dept. at the University of New Mexico where he teaches courses in Microelectronics Test Engineering, Reliability, Failure Analysis, and Digital Electronics.  His research is in the electronics of CMOS IC defects and failures, and in location and analysis of critical timing paths. 

He was the Program Chair of the International Test Conference in 1993 and the General Chair in 1996.  He won several Best Paper Awards with colleagues at ITC and at the ISTFA Conferences.  He was the Editor of the failure analysis magazine EDFA (Electron Device Failure Analysis) from 1999 through 2003.  He has worked with the integrated circuits group at Sandia National Labs for 20 years, and did a 4-month sabbatical leave at the Intel Corp. in 1997.  He has co-authored three books, the latest being: CMOS Electronics: How it Works, How if Fails. Wiley-IEEE Press.

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