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Anne Gattiker
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Anne Gattiker - IBM Corp.

Anne Gattiker is a senior test engineer for IBM Corp. in Austin, Texas.  She won the Best Paper Award at the International Test Conference in 1997.  She was the Vice-Chair of the International Test Conference Program Committee in 2005.  She gives tutorials at ITC and at the International Test & Failure Analysis Conferences on Defect-Based Testing.  Her PhD is from Carnegie-Mellon University.

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